Advances in Imaging and Electron Physics • Volume 161

Peter W. Hawkes (Series Editor)

Table of Contents
Preface p. ix
Contributors p. xi
Future Contributions p. xiii
Principles of Dual-Beam Low-Energy Electron Microscopy - Mankos, Spasov, Munro
Determination of Adequate Parameters for Connected Morphological Contrast Mappings through Morphological Contrast Measures - Mendiola-Santibanez, Terol-Villalobos, Santillan-Mendez
Fractional Fourier Transforms and Geometrical Optics - Moreno, Ferreira
Sparse Image Representation by Directionlets - Velisavljevic, Vetterli, Beferull-Lozano, Dragotti
Advances in Connectivity and Connected Attribute Filters - Wilkinson, Ouzounis
Contents of Volumes 151-160
Index

Academic Press, Advances in Imaging and Electron Physics, Volume 161, Hardback, english, 304 pages

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Advances in Imaging and Electron Physics • Volume 161

Advances in Imaging and Electron Physics • Volume 161

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